Features of scanning electron microscope
Although the scanning electron microscope is a rising star in the microscope family, it has developed rapidly because of its many unique advantages.
1 The instrument has a high resolution, and the secondary electron image can be used to observe the details of the sample surface at about 6nm. Using the LaB6 electron gun, it can be further improved to 3nm.
2 The range of magnification of the instrument is large and can be continuously adjusted. Therefore, you can choose different sizes of field of view for observation according to your needs. At the same time, you can obtain high-brightness clear images that are difficult to achieve with ordinary transmission electron microscopes at high magnification.
3 Observe the depth of field of the sample, the field of view is large, and the image is full of three-dimensional sense. It can directly observe the rough surface with large fluctuations and the uneven metal fracture of the sample, etc., giving people the feeling of being in the micro world.
4 The sample preparation is simple, as long as the block or powder sample is treated or not treated a little, it can be directly observed in the scanning electron microscope, so it is closer to the natural state of the substance.
5The image quality can be effectively controlled and improved by electronic methods, such as automatic maintenance of brightness and contrast, sample tilt angle correction, image rotation, or the latitude of improving image contrast through Y modulation, and the brightness of each part of the image Moderate. Using dual magnification devices or image selectors, images with different magnifications can be viewed simultaneously on the fluorescent screen.
6 Comprehensive analysis is possible. Equipped with a wavelength-dispersive X-ray spectrometer (WDX) or an energy-dispersive X-ray spectrometer (EDX), it has the function of an electronic probe and can also detect reflected electrons, X-rays, cathode fluorescence, transmitted electrons, and Auger Electronics, etc. Expanding the application of scanning electron microscopy to various microscopic and micro-area analysis methods shows the versatility of scanning electron microscopy. In addition, it is also possible to analyze the optional micro-regions of the sample while observing the morphological image; with the attachment of the semiconductor sample holder, the PN junction and micro-defects in the transistor or integrated circuit can be directly observed through the electromotive force image amplifier. Since many SEM electronic probes realize electronic computer automatic and semi-automatic control, the speed of quantitative analysis is greatly improved.